978-620-0-32578-5

Reliability Issues and Approaches in MOSFET circuits

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Summary:

This is the first publication by me on Reliability issues of nano scale devices. As the technology is shrinking the Reliability issues increase exponentially. In this work i had evaluated the life time of a device if under the different condition. Worked on different latest devices like Silicon on Insulator(SOI) and LD MOS. We had proposed different techniques to enhance or increase the life span of devices. Because they impact the operation of different crucial application like automobile, space.

Author:

AMIT KUMAR

Biographie:

Working as an assistant professor at Marwadi Education Foundation since last 7 years. Completed my Masters Degree in VLSI Design from Malaviya National Institute of Technology, Jaipur.

Number of Pages:

72

Book language:

English

Published On:

2019-12-04

ISBN:

978-620-0-32578-5

Publishing House:

LAP LAMBERT Academic Publishing

Keywords:

NBTI, PBTI, HCI, MOSFET circuits

Product category:

TECHNOLOGY / Electronics / General